Autonomous Methodologies for Accelerating X-ray Measurements

17-18 October 2023 – ICDD Headquarters, Newtown Square, PA, USA

REGISTRATION IS CLOSED – DEADLINE HAS PASSED*

NIST and ICDD are hosting a workshop to capture industry input on possible new initiatives to meet critical and emerging technology needs within the industry, with a specific emphasis on leveraging artificial intelligence, data-driven methodologies, and high-throughput/automated workflows for accelerating X-ray-based structural analysis in materials development and manufacturing.

The primary topics for industry input include:

Goals for XRD in the self-driving lab
Automating phase identification and quantitative analysis
Autonomous decision-making and active learning with XRD
New methods and hardware for automated and high-throughput XRD

We are asking industry participants to actively help us understand pre-competitive goals, gaps, challenges, and needs within their organization with regard to artificial intelligence and data-driven methodologies in materials and manufacturing workflows. Aggregated findings may be published in a workshop report.

*NOTICE – The United States Congress has passed a continuing resolution to fund the Federal Government through 17 November. The workshop will be held as planned.

Program - 17-18 October 2023

Agenda – Autonomous Methodologies for Accelerating X-ray Measurements

Day 1: Tuesday, 17 October 2023
09:00 – 09:15 – Welcome Address, Francesca Tavazza, NIST
09:15 – 09:45 – Invited Presentation, Howie Joress, NIST
09:45 – 10:15 – Invited Presentation, Semion Saikin, Kebotix
10:15 – 10:45 – Invited Presentation, Bernd Hinrichsen, BASF
10:45 – 11:00 – Break
11:00 – 12:00 – Working Session: Identify and Prioritize Goals for the Self-Driving Laboratory
12:00 – 13:00 Lunch
13:00 – 13:30 – Invited Presentation, Brian DeCost, NIST
13:30 – 14:00 – Invited Presentation, Alp Sehirlioglu, Case Western Reserve University
14:00 – 14:30 – Invited Presentation, Jessica Lyza, Edward C. Levy Co.
14:30 – 15:00 – Invited Presentation, Tom Blanton, ICDD
15:00 – 15:15 – Break
15:15 – 16:30 – Working Session: Identify and Prioritize Industry Needs for Data and AI-Based Sample Characterization and Quantitative Analysis
16:30 – 17:00 – Day 1 wrap-up: Present and discuss findings.

Day 2: Wednesday, 18 October 2023
09:00 – 09:30 – Invited Presentation, Austin McDannald, NIST
09:30 – 10:00 – Invited Presentation, David Bruhwiler, Radiasoft
10:00 – 10:30 – Invited Presentation, Zachary Trautt, NIST
10:30 – 10:45 – Break
10:45 – 12:00 – Working Session: Identify and Prioritize Industry needs for AI-Driven Decision-Making and Experiment Planning
12:00 – 13:00 – Lunch
13:00 – 13:30 – Invited Presentation, Andrew Jones, Anton Paar
13:30 – 14:00 – Invited Presentation, Arnt Kern, Bruker
14:00 – 14:30 – Invited Presentation, Scott Speakman, Panalytical
14:30 – 15:00 – Invited Presentation, Linda Semenyna, Rigaku
15:00 – 15:15 – Break
15:15 – 16:30 – Working Session: Identify and Prioritize Industry Needs for Next-Generation Hardware and Experimental Methodology
16:30 – 17:00 – Day 2 wrap-up: Present and discuss findings.

Organizing Committee

NIST

Zachary Trautt (Technical Contact) zachary.trautt@nist.gov
Francesca Tavazza
Gilad Kusne
Brian DeCost
Howie Joress
Austin McDannald

ICDD

Steph Jennings (Administrative Contact) sjennings@icdd.com
Thomas Blanton
Soorya Kabekkodu
Jim Kaduk

Registration

Registration is Closed.

Dates: 17-18 October 2023

Location: ICDD Headquarters
12 Campus Blvd
Newtown Square, PA, USA

Registration: $50 which includes coffee breaks and lunches

Registration form and payment must be received by 5 October 2023 (unless attendance capacity is filled before this date) in order to attend the workshop.

Registration will not be conducted onsite. All attendees must pre-register for the workshop.

All participants must complete the 2023 ICDD Event Health Waiver in order to participate.