Powder Diffraction Journal
Practical techniques • Published articles relating to applications • Latest advances in software
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Journal of Materials Characterization
Powder Diffraction is a quarterly journal published by the JCPDS-International Centre for Diffraction Data through the Cambridge University Press. The journal focuses on practical technique, publishing articles relating to the widest range of application from materials analysis to epitaxial growth of thin films and to the latest advances in software. Although practice is emphasized, theory is not neglected, especially as its discussion relates to better understanding of technique.
Cambridge University Press publishes over 280 peer-reviewed academic journals in a wide variety of subject areas. They have over 50 offices across the globe and publish over 40,000 titles by authors from over 100 countries.
Open Access articles, Abstracts, Editorials, and International Reports from Powder Diffraction Journal are available online free of charge at Cambridge Core. A subscription is necessary for articles, including early viewing of FirstView articles. Authors, titles, and page numbers are listed in the Past Issue Pages.
LATEST ISSUES
Vol. 39 No.3 September 2024
On the Cover: The cover figure for this issue of Powder Diffraction was prepared using figures from the manuscript “Bimodal microstructural characterization of Si powder using X-ray diffraction: the role of peak shape” by Ashok Bhakar and colleagues of the Raja Ramanna Centre for Advanced Technology, Homi Bhabha National Institute, Indore, India.
The cover figure shows the results of profile fitting for the characterization of bi-modal Rietveld refinement for Si powder. The fitting of the X-ray powder diffraction data used pseudo-Voigt (pV) and Thompson-Cox-Hastings (TCH) peak profile functions. The manuscript clearly demonstrates that for high-quality (e.g., synchrotron source) data, it is possible to Rietveld refine the bimodal distribution of crystallite sizes.
Vol. 39 No.2 June 2024
On the Cover: The cover figure for this issue of Powder Diffraction was prepared using figures from the manuscript “Characterization of MoS2 Films Via Simultaneous Grazing Incidence X-Ray Diffraction and Grazing Incidence X-ray Fluorescence (GIXRD/GIXRF)” by M.A. Rodrigues, et al of Sandia National Laboratories. The GIXRD data provides information on the film density and grain orientation (texture) as shown on the left side. The GIXRF yields the chemical composition, shown on the right. The authors showed that combining the two sets of results enabled isolation and decoupling the film density, composition and microstructure. Such extensive combined characterization data can be used to enhance the PVD deposited MoS2 thin films used as solid lubricants for extreme operating environments.
“PDF-5+: a Comprehensive Powder Diffraction File for Materials Characterization“
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ICDD’s international journal, Powder Diffraction, published quarterly plus an annual special topical issue, in collaboration with the Denver X-ray Conference Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis (AXA). Beginning in 2006, ICDD offered access to of the previous year’s edition of AXA to Powder Diffraction institutional print/online subscribers. This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis.
Subject coverage includes:
- Techniques and procedures in X-ray powder diffractometry
- Advances in instrumentation
- Study of materials including organic materials, minerals, metals and thin film superconductors
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Notes:
- PDJ is an Open Access – Hybrid Journal
Please review the Instructions for Authors for more information about Open Access options. - Open Access Waivers and Discounts – If your institution has a Read and Publish agreement, you may publish your article Gold OA at no cost to you, or with discount for your article processing charge (APC).
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CODEN: PODIE2 ISSN: 0885-7156 e-ISSN: 1945-7413
EDITORIAL BOARD
Editor-in-Chief
Camden Hubbard, Applied Diffraction Services
camden.hubbard@me.com
Managing Editor
Nicole Ernst Boris, International Centre for Diffraction Data
boris@icdd.com
Production Editor
Amy Woolf, Cambridge University Press, USA
pdjproduction@cambridge.org
Editors for New Diffraction Data
Soorya Kabekkodu, International Centre for Diffraction Data
kabekkodu@icdd.com
Associate Editor for New Diffraction Data
Frank Rotella, Argonne National Laboratory (Retired)
fjrotella1949@gmail.com
Editors
Xiaolong Chen, Institute of Physics, Chinese Academy of Sciences
xlchen@iphy.ac.cn
José Miguel Delgado, Universidad de Los Andes
migueld@ula.ve
Norberto Masciocchi, Università dell’Insubria
norberto.masciocchi@uninsubria.it
Editors for Crystallography Education
James Kaduk, Poly Crystallography Inc.
Kaduk@polycrystallography.com
Brian H. Toby, Argonne National Lab, Advanced Photon Source
brian.toby@anl.gov
International Reports Editor
Winnie Wong-Ng, National Institute of Standards and Technology
winnie.wong-ng@nist.gov
Calendar of Meetings and Workshops Editor
Gang Wang, Institute of Physics, Chinese Academy of Sciences
gangwang@iphy.ac.cn
ADVISORY BOARD
The PDJ Advisory Board is served by ICDD Regional Co-Chairs and members of Cambridge University Press
Evgeny Antipov
Moscow State University, Russia
Xiaolong Chen
Chinese Academy of Sciences, People’s Republic of China
Jose Miguel Delgado
University de Los Andes, Venezuela
Steve Hillier
The James Hutton Institute, Scotland, UK
Takashi Ida
Nagoya Institute of Technology, Japan
Allison Keene
Cambridge University Press, USA
Robert Dinnebier
Max-Planck Institute fuer Festkoerperforschung, Germany
Vanessa Peterson
Australian Nuclear Science and Technology Organisation, Australia
Mark Rodriguez
Sandia National Labs, USA
T.N. Guru Row
Indian Institute of Science, India
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