Powder Diffraction Journal
Volume 19 – 2004
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Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge. To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.
Powder Diffraction – Vol. 19 Number 1 – March 2004
EDITORIAL
Ting C. Huang
Special March 2004 Issue (1)
Ting C. Huang
New Managing Editor (2)
TECHNICAL ARTICLES
X-ray Studies of Art and Archaeological Objects
M. Schreiner, B. Früuhmann, D. Jembrih-Simbürger, and R. Linke
X-rays in art and archaeology: An overview (3)
Brian Newbury, Bruce Stephenson, Jon Almer, Michael Notis, G. S. Cargill, III, G. Brian Stephenson, and Dean Haeffner
Synchrotron applications in archaeometallurgy: Analysis of high zinc brass astrolabes (12)
Michael Mantler, Jan Klikovits
Analysis of art objects and other delicate samples: Is XRF really
nondestructive? (16)
Powder Diffraction Databases
T. G. Fawcett, S. N. Kabekkodu, J. Faber, F. Needham, and F. McClune
Evaluating experimental methods and techniques in X-ray diffraction using 280 000 data sets in the Powder Diffraction File (20)
J. Faber, C. A. Weth, and J. Bridge
A plug-in program to perform Hanawalt or Fink search-indexing using organics entries in the ICDD PDF-4/organics 2003 database (26)
Powder Diffraction Analysis
A. Kishi, H. Toraya
Simultaneous measurements of X-ray diffraction ~XRD! and differential scanning calorimetry ~DSC! data under controlled humidity condition: Instrumentation and application to studies on hydration, dehydration, and rehydration processes of pharmaceutical compounds (31)
Tom Blanton, Craig Barnes, Julie Putrelo, Agyare Yeboah, and Steve Switalski
Materials characterization using a novel simultaneous near-infrared/X-ray diffraction instrument (36)
G. Walenta, T. Füllmann
Advances in quantitative XRD analysis for clinker, cements, and cementitious additions (40)
Thin Film Analysis
B. K. Tanner, T. P. A. Hase, T. A. Lafford, and M. S. Goorsky
Grazing incidence in-plane X-ray diffraction in the laboratory (45)
J. F. Woitok
Structural characterization of SiGe and SiGe:C heterostructures using a combination of X-ray scattering methods (49)
Kazuhiro Takada, Takashi Noma, Takeshi Togano, Taihei Mukaide, and Atsuo Iida
X-ray microdiffraction study of the half-V-shaped switching liquid crystal (53)
C. E. Murray, I. C. Noyan, B. Lai, and Z. Cai
Strain effects in thin film/Si substrates revealed by X-ray microdiffraction (56)
Texture and Stress Analysis
Hans J. Bunge
Texture and microstructure analysis with high-energy synchrotron radiation (60)
Sven C. Vogel, Christian Hartig, Luca Lutterotti, Robert B. Von Dreele, Hans-Rudolf Wenk, and Darrick J. Williams
Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method (65)
E. D. Specht, P. F. Tortorelli, and P. Zschack
In situ measurement of growth stress in alumina scale (69)
E. Eiper, R. Resel, C. Eisenmenger-Sittner, M. Hafok, and J. Keckes
Thermally-induced stresses in thin aluminum layers grown on silicon (74)
X-ray Fluorescence Analysis
Y. Takahashi, K. Hayashi, and E. Matsubara
Development and application of laboratory X-ray fluorescence holography equipment (77)
S. Török, J. Osán, B. Beckhoff, and G. Ulm
Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS (81)
Christopher G. Worley, Lisa P. Colletti
Improvements in XRF specimen preparation using the dried residue method: Gallium in plutonium metal (87)
Horst Ebel
Quantitative analysis by X-ray induced total electron yield ~TEY! compared to XRFA (90)
Cumulative Author Index (97)
Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge. To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.
Powder Diffraction – Vol. 19 Number 2 – June 2004
EDITORIAL
Tom Blanton
Using X-ray and Electron Scattering Techniques (99)
SPECIAL SECTION ON MICROANALYSIS
R. P. Goehner, J. R. Michael
Microdiffraction phase identification in the scanning electron microscope (SEM) (100)
I. C. Noyan, S. K. Kaldor
Measurement volume considerations in X-ray microdiffraction stress analysis (104)
Bob Baoping He
Microdiffraction using two-dimensional detectors (110)
George J. Havrilla, Thomasin Miller
Micro X-ray fluorescence in materials characterization (119)
TECHNICAL ARTICLES
James A. Kaduk
Crystal structure of guaifenesin, 3-(2-methoxyphenoxy)-1,2-propanediol (127)
C. E. Botez, P. W. Stephens, and Oladipo Omotoso
Crystal structure of dicalcium chromate hydrate (133)
A. Martinelli, M. Ferretti, and C. Castellano
Effect of Cr doping on the structure of r0.55Ca0.45)(Mn1-yCry)O3: A Rietveld refinement study (137)
Rashmi, Nahar Singh, and A. K. Sarkar
Application of the Rietveld method to quantitative analysis of impurities in synthetic diamond powder (141)
Svend Erik Rasmussen, Sidsel Grundvig, and Walter L. Friedrich
Composition of pigments of Santorini frescoes: The Rietveld method as an aid in qualitative phase analysis (145)
M. Mizuno, M. Hamada, M. Hashimoto, M. Harada, K. Eda, K. Yamamura, T. Kamiyama, and K. Oikawa
Conformational phase transition of deuterated p-bromobenzyl alcohol as studied by neutron powder diffraction (149)
Werner Fischer, Lorenz Singheiser, Debabrata Basu, and Amit Dasgupta
Crystal structure of Ca1-xSrxZr4(PO4)6 (0=<x=<1) (153)
Abderrahim Aatiq, Hicham Dhoum
Structure of AFeTi(PO4)3 (A5Ca,Cd) Nasicon phases from powder X-ray data (157)
B. Manoun, A. El Jazouli, S. Krimi, and A. Lachgar
Synthesis and crystallochemistry of Na4CrNi(PO4)3 (162)
NEW DIFFRACTION DATA
Alla B. Antonova, Oleg S. Chudin, and Sergei D. Kirik
New X-ray powder diffraction data for the series CpMn(CO)3, [Cp(CO)2Mn]2(μ-C==CHPh), and [Cp(CO)2Mn]2(μ – C4Ph2) complexes (Cp=η5 – C5H5)
S. Pikus, E. Olszewska, M. Majdan, and L. Pajak
High quality powder diffraction data for A-type zeolite with selected divalent d-electron metals (172)
Ming-Tao Zhang, Yuan-Yuan Qiao, Shao-Fan Lin, and Xin-Kan Yao
X-ray powder diffraction analysis of three 4-tert-butylcalix(4)arenes (181)
DENVER X-RAY CONFERENCE
D. Flaherty
2004 Denver X-ray Conference
INTERNATIONAL REPORTS
Regional Reports (206)
Calendar of Meetings (210)
Short Courses and Workshops (213)
Short Obituary – John Charles Taylor (215)
Cumulative Author Index (217)
Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge. To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.
Powder Diffraction – Vol. 19 Number 3 – September 2004
TECHNICAL ARTICLES
V. M. Bouznik, S. D. Kirik, L. A. Solovyov, and A. K. Tsvetnikov
A crystal structure of ultra-dispersed form of polytetrafluoroethylene based on X-ray powder diffraction data(219)
V. G. Vlasenko, A. T. Shuvaev, A. L. Nivorozkin, and A. I. Uraev
XRD and EXAFS studies of azomethynic copper metallochelates as models of blue copper proteins (225)
O. Pritula, L . Smrcok, D. M. Tobbens, and V. Langer
X-ray and neutron Rietveld quantitative phase analysis of industrial Portland cement clinkers (232)
Ángeles G. De la Torre, María-Gema López-Olmo, Carmen Álvarez-Rua, Santiago García-Granda, and Miguel. A. G. Aranda
Structure and microstructure of gypsum and its relevance to Rietveld quantitative phase analyses (240)
Il Mo Kang, Hi-Soo Moon, Yungoo Song, and Myung Hun Kim
Equations for quantifying Fe and K within the illite structure using X-ray powder diffraction (247)
A. Le Bail
Monte Carlo indexing with McMaille (249)
R. Martínez-García, E. Reguera, J. Rodriguez, J. Balmaseda, and J. Roque
Crystal structures of some manganese(II) and cadmium hexacyanoferrates (II,III) and structural transformations related to the sorption of Cesium (255)
S. N. Achary, M. D. Mathews, and A. K. Tyagi
Synthesis and Rietveld refinements of monoclinic Er2BaF8 (265)
NEW DIFFRACTION DATA
Pedro P. Corbi, Antonio C. Massabni, and Claudio M. Costa-Neto
X-ray powder diffraction analysis of a new palladium~II! amino acid complex (270)
Abderrahim Aatiq
Synthesis and structural characterization of ASnFe(PO4)3 (A=Na2,Ca,Cd) phosphates with the Nasicon type structure (272)
D. D. Khalyavin, A. M. R Senos, and P. Q. Mantas
Crystal structure of Sr2MgWO6 and Ba2SrWO6 determined by powder X-ray diffraction (280)
R. Martínez-García, E. Reguera, J. Balmaseda, G. Ramos, and H. Yee-Madeira
On the crystal structures of some nickel hexacyanoferrates (II,III) (284)
A. Rafalska-Lasocha, B. Wlodarczyk-Gajda, M. Grzywa, and W. Lasocha
X-ray powder diffraction investigations of phenol derivatives (292)
Ming-Tao Zhang, Yuan-Yuan Qiao, Shao-Fan Lin, and Xin-Kan Yao
X-ray powder diffraction analysis of three two-component molecular crystals: 4-chloroanilinium and chloronitrobenzoic acids (296)
INTERNATIONAL REPORTS
ICDD® Spring Meetings (302)
Calendar of Meetings (312)
Short Courses and Workshops (314)
Cumulative Author Index (316)
Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge. To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.
Powder Diffraction – Vol. 19 Number 4 – December 2004
EDITORIAL
Ting C. Huang
Special section on selected papers from the 2003 Chinese National Symposium on X-ray Diffraction (319)
SELECTED PAPERS FROM 2003 CHINESE NATIONAL SYMPOSIUM ON XRD
G. B. Song, J. K. Liang, F. S. Liu, L. T. Yang, J. Luo, and G. H. Rao
Subsolidus phase relations and crystal structures in the Pr1+xBa2-xCu3O7± δ system at 950 °C (320 )
Xiurong Hu, Ziqin Yuan, and Guanglie Lu
Determination of crystal structures of polymorphic chlorothalonil using Monte Carlo simulated annealing and Rietveld refinement (325)
H. L. Cai, X. S. Wu, F. Z. Wang, A. Hu, S. S. Jiang, J. F. Feng, B. Qian, J. H. Xing, C. J. Chen, X. Chen, M. H. Sun, and Z. H. Wu
Crystal structure of Cu doped La0.67Ca0.33MnO3 by Rietveld refinement (329)
H. W. Ma, J. K. Liang, G. Y. Liu, and G. H. Rao
UACIEM: A new method to extract reliable intensities of nonequivalent systematical overlapping reflections from powder diffraction data (333 )
YuanYuan Qiao, YunFei Xi, DongTao Zhuo, JiJun Wang, and ShaoFan Lin
Qualitative phase analysis system for crystalline mixtures based on X-ray powder diffraction file (340 )
J. Xu, X. S. Wu, B. Qian, J. F. Feng, S. S. Jiang, W. S. Tan, C. J. Chen, X. Chen, M. H. Sun, and Z. H. Wu
An X-ray scattering study on inverted Ge–Si huts grown at low temperatures (347)
Wei Tao Zheng, Xin Wang, Xianggui Kong, Hongwei Tian, Shansheng Yu, Zhudi Zhao, and Xiaotian Li
Crystal structures and magnetic properties of Fe–N thin films deposited by dc magnetron sputtering (352)
TECHNICAL ARTICLES
Vanessa Kate Peterson
A Rietveld refinement investigation of a Mg-stabilized triclinic tricalcium silicate using synchrotron X-ray powder diffraction data (356)
S. Pikus, E. Olszewska, I. Mel’nyk, and R. E. Gladyshevskii
X-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe (359)
Axel Nørlund Christensen
Solution of heavy atom structures from powder diffraction data using direct methods. A review of structures solved at Aarhus University (362)
J. Keckes, M. Hafok, E. Eiper, A. Hofer, R. Resel, and C. Eisenmenger-Sittner
Evaluation of experimental stress–strain dependence in thermally cycled Al thin film on Si(100) (367)
NEW DIFFRACTION DATA
Jirong Huang, Lingmin Zeng, and Zhihui Sun
X-ray powder diffraction data and Rietveld refinement of CrFe3NiSn5 (372)
Kacem Sbai, Said Belaaouad, Abdelkebir Kenz, El Mostafa Tace, and Malika Tridane
Chemical preparation and crystal data for two condensed phosphates NiCs4(PO3)6 and NiK4(P3O9)2 (375)
A. Rafalska-Lasocha, M. Grzywa, B. Wlodarczyk-Gajda, and W. Lasocha
Powder diffraction investigations of naphthalenesulfonic acids and their complexes with DMAN (378)
Koichiro Fukuda, Hiroyuki Matsubara, Kazuko Fukutani, and Hideto Yoshida
Powder X-ray diffraction data of a new calcium zirconium phosphate Ca7ZrsPO4d6 (385)
INTERNATIONAL REPORTS
Howard F. McMurdie—An Appreciation (388)
The 53rd Annual Denver X-ray Conference (390)
Review of Molecular Modeling of Clays and Mineral Surfaces (392)
Calendar of Meetings (392)
Short Courses & Workshops (393)
Index to Volume 18
PACS® Headings Used in the Present Index (395)
Subject Index to Volume 19 (396)
Author Index to Volume 19 (400)